The SKIF X–Techno Beamline Project | Sciact - CRIS-система Института катализа

The SKIF X–Techno Beamline Project Научная публикация

Журнал

Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques
ISSN: 1027-4510 , E-ISSN: 1819-7094

Вых. Данные

Год: 2023, Том: 17, Номер: 6, Страницы: 1273-1277 Страниц : 5 DOI: 10.1134/s1027451023060150

Ключевые слова

synchrotron radiation, experimental beamline, X-ray beam, spectral measurements, X-ray lithography, grazing incidence mirror, monochromator, materials science, absorption filter, detector

Авторы

Nazmov V.P. ^1,2 , Goldenberg B.G. ^1,3

Организации

1	Budker Institute of Nuclear Physics, SB RAS, Novosibirsk, 630090 Russia
2	Institute of Solid State Chemistry and Mechanochemistry, SB RAS, Novosibirsk, 630090 Russia
3	Center for Collective Use SKIF, Boreskov Institute of Catalysis, SB RAS, Koltsovo, 630559 Russia

Beamlines on synchrotron radiation sources may impose different and sometimes even incompatible requirements to the X-ray beam. In some cases, implementation of probe methods for examination of samples in the mapping mode necessitates beams with the smallest possible cross–section. In contrast to this, radiation processing of material and manufacture of a commercial product using X-ray lithography approach require an X-ray beam with a relatively large area and providing a uniform exposure field. On the beamline X-Techno under development for the synchrotron radiation source SKIF, it will be possible to form synchrotron radiation beams up to 100 mm in size in the horizontal plane, differing in the spectral composition. Such beams will be used in any of the beamline’s three research chambers for study of radiation effects in materials, as well as for creation of structures in the micro- and nano-size range. The design of the beamline will enable study of the physicochemical properties of materials exposed to X-rays in the spectral range from 2 to 70 keV.

Nazmov V.P. , Goldenberg B.G.
The SKIF X–Techno Beamline Project
Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. 2023. V.17. N6. P.1273-1277. DOI: 10.1134/s1027451023060150 WOS Scopus РИНЦ CAPlus OpenAlex СКИФ ID

Назьмов В.П. , Гольденберг Б.Г.
Проект экспериментальной станции X-Techno для источника синхротронного излучения “СКИФ”
Поверхность. Рентгеновские, синхротронные и нейтронные исследования. 2023. №11. С.107-112. DOI: 10.31857/S1028096023110158 РИНЦ OpenAlex СКИФ ID

Поступила в редакцию:	15 янв. 2023 г.
Принята к публикации:	9 февр. 2023 г.
Опубликована в печати:	8 дек. 2023 г.
Опубликована online:	8 дек. 2023 г.

Web of science:	WOS:001142593700006
Scopus:	2-s2.0-85178879187
РИНЦ:	59905699
Chemical Abstracts:	2023:2574147
OpenAlex:	W4389488475
СКИФ ID:	2842

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