Chemical Composition Dependent Raman Scattering Spectroscopy of MBE Grown Manganese ‐ Based Bismuth Telluride Topological Insulator Thin Films Full article
Journal |
Journal of Raman Spectroscopy
ISSN: 0377-0486 , E-ISSN: 1097-4555 |
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Output data | Year: 2025, Volume: 56, Number: 5, Pages: 409-419 Pages count : 11 DOI: 10.1002/jrs.6779 | ||||||||||||
Tags | magnetic topological insulators | molecular beam epitaxy | polarization-resolved resonant Raman spectroscopy | vibrational modes | ||||||||||||
Authors |
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Affiliations |
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Funding (3)
1 | Ministry of Science and Higher Education of the Russian Federation | FSUS-2024-0020 |
2 | Ministry of Science and Higher Education of the Russian Federation | FWUR-2024-0042 |
3 | Russian Science Foundation | 23-12-00016 (123060600015-0) |
Abstract:
Chemical composition dependent vibrational modes of manganese-based bismuth telluride (MBT) magnetic topological insulators thin films grown by molecular beam epitaxy were studied by Raman spectroscopy and compared with the vibrational modes of Bi2Te3 films. Intensity of E3g TO mode was much stronger in Bi efficient MBT film. In contrast, vibrational cross-section of A21g LO mode was stronger in Bi deficient MBT compound. E3g TO mode corresponds to in-plane vibrations of Bi-Te atomic layers. Deficiency of Bi atoms in the MBT indicated that the vibrational degree of freedom of Bi-Te in the septuple unit cell was less probable. Antisymmetric out-of-phase vibration of Te-Te atoms resulted in A21g LO mode in which Bi atom was stationary, therefore vibrational cross-section of this mode for Bi deficient MBT film was stronger. A resonantly excited Eg and A1g modes was observed at excitation energy 1.57 eV associated to deformation potential and Frohlich electron–phonon coupling, respectively
Cite:
Kumar N.
, Ishchenko D.
, Milekhin I.
, Kyrova E.
, Fedosenko E.
, Milekhin A.
, Tereshchenko O.
Chemical Composition Dependent Raman Scattering Spectroscopy of MBE Grown Manganese ‐ Based Bismuth Telluride Topological Insulator Thin Films
Journal of Raman Spectroscopy. 2025. V.56. N5. P.409-419. DOI: 10.1002/jrs.6779 WOS Scopus OpenAlex publication_identifier_short.sciact_skif_identifier_type
Chemical Composition Dependent Raman Scattering Spectroscopy of MBE Grown Manganese ‐ Based Bismuth Telluride Topological Insulator Thin Films
Journal of Raman Spectroscopy. 2025. V.56. N5. P.409-419. DOI: 10.1002/jrs.6779 WOS Scopus OpenAlex publication_identifier_short.sciact_skif_identifier_type
Dates:
Submitted: | Nov 18, 2024 |
Accepted: | Jan 24, 2025 |
Published print: | May 1, 2025 |
Identifiers:
Web of science: | WOS:001420181000001 |
Scopus: | 2-s2.0-105002488804 |
OpenAlex: | W4407499247 |
publication_identifier.sciact_skif_identifier_type: | 3698 |
Citing:
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