High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality - Доклады на конференциях | Sciact - CRIS-система Института катализа

High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality Доклады на конференциях

Язык

Английский

Тип доклада

Устный

Конференция

The Conference and School for Young Scientists High-temperature X-ray Diffraction and X-ray Diffraction of Nanomaterials
19-21 окт. 2020 , Санкт-Петербург

Авторы

Захаров Борис Александрович ^1,2

Организации

1	Институт катализа им. Г.К. Борескова СО РАН
2	Новосибирский национальный исследовательский государственный университет

Zakharov B.A.
High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality
The Conference and School for Young Scientists High-temperature X-ray Diffraction and X-ray Diffraction of Nanomaterials 19-21 Oct 2020