High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality Conference attendances
| Language | Английский | ||||
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| Participant type | Устный | ||||
| Conference |
The Conference and School for Young Scientists High-temperature X-ray Diffraction and X-ray Diffraction of Nanomaterials 19-21 Oct 2020 , Санкт-Петербург |
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Cite:
Zakharov B.A.
High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality
The Conference and School for Young Scientists High-temperature X-ray Diffraction and X-ray Diffraction of Nanomaterials 19-21 Oct 2020
High-Pressure Experiments and X-Ray Diffraction Data Reduction: The Difference from Ambient Pressure Studies and Factors Influencing Data Quality
The Conference and School for Young Scientists High-temperature X-ray Diffraction and X-ray Diffraction of Nanomaterials 19-21 Oct 2020