Instrumentally Induced Differential Charging Effect in XPS – Turning Drawback to Advantage - Доклады на конференциях | Sciact - CRIS-система Института катализа

Instrumentally Induced Differential Charging Effect in XPS – Turning Drawback to Advantage Доклады на конференциях

Язык

Английский

Тип доклада

Стендовый

Конференция

EuropaCat-XII: 12th European Congress on Catalysis “Catalysis: Balancing the use of fossil and renewable resources”
30 авг. - 4 сент. 2015 , Казань

Авторы

Квон Рэн Ил ¹ , Бухтияров Андрей Валерьевич ^1,2 , Нартова Анна Владимировна ^1,2,3 , Макаров Эдгар Михайлович ^1,2,3 , Кулагина Мария Алексеевна ^1,3 , Штерк Генрих Владимирович ^1,2,3 , Бухтияров Валерий Иванович ^1,2,3

Организации

1	Институт катализа им. Г.К. Борескова СО РАН
2	Новосибирский национальный исследовательский государственный университет
3	Новосибирский национальный исследовательский государственный университет

The employing of instrumentally induced surface charging for X-Ray Photoelectron Spectroscopy investigation of supported metal catalysts is described. The interpretation of the observed effects in XPS spectra of conductive, poorly conductive and non-conductive specimens (Sibunit, tantalum and tungsten oxides, alpha-alumina) is discussed. The obtained results prove that such ad hoc approach gives the exclusive additional information on the population density of metal nanoparticles at the non-conductive support surface, and – with a priori knowledge about metal loading – allows estimating the average size of such particles directly from the spectroscopic data

Kvon R.I. , Bukhtiyarov A.V. , Nartova A.V. , Makarov E.M. , Kulagina M.A. , Shterk G.V. , Bukhtiyarov V.I.
Instrumentally Induced Differential Charging Effect in XPS – Turning Drawback to Advantage
EuropaCat-XII: 12th European Congress on Catalysis “Catalysis: Balancing the use of fossil and renewable resources” 30 Aug - 4 Sep 2015