Instrumentally Induced Differential Charging Effect in XPS – Turning Drawback to Advantage - Conference attendances | Sciact - CRIS-system of Boreskov Institute of Catalysis

Instrumentally Induced Differential Charging Effect in XPS – Turning Drawback to Advantage Conference attendances

Language

Английский

Participant type

Стендовый

Conference

EuropaCat-XII: 12th European Congress on Catalysis “Catalysis: Balancing the use of fossil and renewable resources”
30 Aug - 4 Sep 2015 , Казань

Authors

Kvon Ren Il ¹ , Bukhtiyarov Andrey Valerievich ^1,2 , Nartova Anna Vladimirovna ^1,2,3 , Makarov E'dgar Mikhajlovich ^1,2,3 , Kulagina Mariya Alekseevna ^1,3 , Shterk Genrikh Vladimirovich ^1,2,3 , Bukhtiyarov Valerii Ivanovich ^1,2,3

Affiliations

1	Boreskov Institute of Catalysis SB RAS
2	Novosibirsk National Research University
3	Novosibirsk National Research University

The employing of instrumentally induced surface charging for X-Ray Photoelectron Spectroscopy investigation of supported metal catalysts is described. The interpretation of the observed effects in XPS spectra of conductive, poorly conductive and non-conductive specimens (Sibunit, tantalum and tungsten oxides, alpha-alumina) is discussed. The obtained results prove that such ad hoc approach gives the exclusive additional information on the population density of metal nanoparticles at the non-conductive support surface, and – with a priori knowledge about metal loading – allows estimating the average size of such particles directly from the spectroscopic data

Kvon R.I. , Bukhtiyarov A.V. , Nartova A.V. , Makarov E.M. , Kulagina M.A. , Shterk G.V. , Bukhtiyarov V.I.
Instrumentally Induced Differential Charging Effect in XPS – Turning Drawback to Advantage
EuropaCat-XII: 12th European Congress on Catalysis “Catalysis: Balancing the use of fossil and renewable resources” 30 Aug - 4 Sep 2015