Rapid Method for Separating the Structure-Sensitive Portion of Intensity in X-ray-Diffractometry Full article
Journal |
Industrial Laboratory
ISSN: 0019-8447 |
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Output data | Year: 1995, Volume: 61, Number: 2, Pages: 88-91 Pages count : 4 | ||
Tags | Diffraction | ||
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Abstract:
A method for constructing the radial distribution function (RDF) from x-ray diffraction data is proposed. The method is based on high-frequency filtration of the total intensity to obtain its structure-sensitive portion, using cubic B-splines and the least-squares technique to approximate the background function and Compton scattering. The method makes unnecessary the use of a crystal monochromator and shortens substantially the time for an experiment.
Cite:
Kolosov P.E.
Rapid Method for Separating the Structure-Sensitive Portion of Intensity in X-ray-Diffractometry
Industrial Laboratory. 1995. V.61. N2. P.88-91. WOS
Rapid Method for Separating the Structure-Sensitive Portion of Intensity in X-ray-Diffractometry
Industrial Laboratory. 1995. V.61. N2. P.88-91. WOS
Original:
Колосов П.Е.
Экспресс-методика выделения структурно-чувствительной части интенсивности в методе рентгенографии
Заводская лаборатория (до 1995 г.). 1995. Т.61. №2. С.27-30.
Экспресс-методика выделения структурно-чувствительной части интенсивности в методе рентгенографии
Заводская лаборатория (до 1995 г.). 1995. Т.61. №2. С.27-30.
Dates:
Published print: | Feb 1, 1995 |
Identifiers:
Web of science | WOS:A1995TC23200008 |
Citing:
DB | Citing |
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Web of science | 1 |