Polycrystal Software Package for IBM/PC Full article
Journal |
Journal of Structural Chemistry
ISSN: 0022-4766 , E-ISSN: 1573-8779 |
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Output data | Year: 1996, Volume: 37, Number: 2, Pages: 332-334 Pages count : 3 DOI: 10.1007/BF02591064 | ||
Tags | Integral Intensity; Interplanar Distance; Priority Rule; Symmetry Element; Reflection Index | ||
Authors |
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Affiliations |
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Funding (1)
1 | Russian Foundation for Basic Research | 93-03-04843 |
Abstract:
A software package for X-ray diffraction studies of polycrystalline materials has been developed for IBM/PC. The system includes programs for calculating X-ray diffractograms, interatomic distances, and polyhedra, and also for refinement of lattice parameters and crystal structures by integral intensities of diffraction peaks.
Cite:
Tsybulya S.V.
, Cherepanova S.V.
, Solovʹeva L.P.
Polycrystal Software Package for IBM/PC
Journal of Structural Chemistry. 1996. V.37. N2. P.332-334. DOI: 10.1007/BF02591064 WOS Scopus РИНЦ OpenAlex
Polycrystal Software Package for IBM/PC
Journal of Structural Chemistry. 1996. V.37. N2. P.332-334. DOI: 10.1007/BF02591064 WOS Scopus РИНЦ OpenAlex
Original:
Цыбуля С.В.
, Черепанова С.В.
, Соловьева Л.П.
Система программ Поликристалл для IBM/PC
Журнал структурной химии. 1996. Т.37. №2. С.379-382. РИНЦ ANCAN
Система программ Поликристалл для IBM/PC
Журнал структурной химии. 1996. Т.37. №2. С.379-382. РИНЦ ANCAN
Dates:
Submitted: | Mar 1, 1995 |
Published print: | Mar 1, 1996 |
Identifiers:
Web of science: | WOS:A1996VL83500022 |
Scopus: | 2-s2.0-27544493201 |
Elibrary: | 13222159 |
OpenAlex: | W2071445773 |